X-ray Diffraction Analysis Xrd Diffractometer

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Customization: Available
After-sales Service: Lifelong
Warranty: 1 Year
Manufacturer/Factory, Trading Company
Diamond Member Since 2020

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  • X-ray Diffraction Analysis Xrd Diffractometer
  • X-ray Diffraction Analysis Xrd Diffractometer
  • X-ray Diffraction Analysis Xrd Diffractometer
  • X-ray Diffraction Analysis Xrd Diffractometer
  • X-ray Diffraction Analysis Xrd Diffractometer
  • X-ray Diffraction Analysis Xrd Diffractometer
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Overview

Basic Info.

Model NO.
CY-7200
Max Diameter of Workpiece
<500mm
Mass Scope of Workpiece
<900kg
Type
Balancing Machine
Maxcapacity
>1000KN
Accuracy Grade
0.5
Load Way
Electronic Load
Loading Method
Dynamic Load
Display
Needle
Control
Computer Control
Weight
0-100Kg
Power Source
AC220V
Oil Cylinder Position
Under
Avelength Range
175nm ~ 800nm
Resolution (Fwhm)
0.009nm (at 313nm)
Wavelength Stop
±0.001nm
Photomultiplier Tube
R306 and One Other Type
Transport Package
Carton
Specification
75cm*65cm*70cm
Trademark
CYEEYO
Origin
Shan Dong
HS Code
9027500090
Production Capacity
100

Product Description

                                               
                                              diffraction analysis XRD DiffractometerX-ray Diffraction Analysis Xrd DiffractometerX-ray Diffraction Analysis Xrd Diffractometer



 1. Profile:
It is designed for commercial process and quality control. It is a concentration of advanced technology of XRD production, with multi-function and miniaturization. It can do qualitative analysis, quantitative analysis and crystal structure analysis on metal and nonmetal sample, especially for catalyst, titanium dioxide, cement and pharmacy industries.
2. Equipment Performance:
  1. High frequency high voltage X-ray generator has greater stability, so it guarantees the repeatability of the data.
  2. Goniometer θs, θd arm adopts servo motor drive and optical encoder control technology, so the goniometer rotates more smoothly, the diffraction angle measuring is more accurate and the linearity is better. Within the diffraction angle range, the diffraction linearity <0.02.
  3. The scattered ray protective device is safer and more reliable. When it is measuring samples, the protective door will be auto-locked to avoid the radiation to the people.
  4. CY-7200XRD adopts the most advanced metal ceramic X-ray tube, it has long service life (3000 hours).
     5.The compact structure can installed onto the platform without special laboratory environment. It is easy for operation and                maintenance.
X-ray Diffraction Analysis Xrd Diffractometer3. Application:
CY-7200XRD can do qualitative and quantitative analysis on polycrystalline material. During qualitative analysis, it will identify the unknown structure by comparing the measuring data with known phase data base. During quantitative analysis, it can describe the characteristics of the solid mixture, so that to confirm relative content of the crystalline compounds or un-crystallized phase.                                                                                                                                                                       
Content measuring of asbestos in mixture by CY-7200 
X-ray Diffraction Analysis Xrd Diffractometer
Nucleotide analog medicine structure analysis by CY-7200
X-ray Diffraction Analysis Xrd Diffractometer4. Parameters:
Service rating(Tube voltage, tube current) 600W(40kV,15mA)  Stability:0.005%
X-ray tube Metal-ceramic X-ray tube, Cu target, Power 2.4kW, Focus size:1 x 10 mm;
Goniometer θs-θd , diffraction radius 150mm
Measuring method Continuous, stepping, Omg
Angular measurement range Druing leakage time, θs/θd is -3°~150°.  
Minimum step width 0.0001°
Angular reproducibility 0.0001°
Drive mode servo motor drive + optical encoder control technology
Angle Positioning speed 1500°/min
Counter Closed Proportional detector
 Energy spectrum resolution <25%
Max. linear counting rate ≥5×105cps(Proportional)
Computer Dell laptop
Soft ware Controlling software Windows 10 operating system; control the tube voltage, tube current, shutter of the X-ray generator and do aging training automatically; Control the goniometer continuous or stepping scanning and diffraction data collection; do routine processing: automatic peak-seeking, manual peaking-seeking, integrated intensity, peak height, core, background deduction, smoothness, Peak shape amplification and spectrogram comparation, etc.
Data processing software Qualitative and quantitative analysis of material phases , Kα1 ,α2 peeling, Full spectrum fitting, peak fitting, half-width and grain size calculation, crystal cell measuring, second kind stress calculation, diffraction line indexation, multiple plotting, 3D plotting, diffraction data calibration, background subtraction, quantitative analysis without standards, full spectral image fitting (WPF), XRD diffraction image simulation, etc.
Scattered radiation protection Lead+ lead glass protection, shutter windows and protective guard linkage, the scattered radiation dose not exceeding 1μSv/h.
Instrument Comprehensive regulation ≤1‰
Overall dimension 640×530×770(w×d×h)mm
5. Standard Configuration List of CY-7200XRD:
Part Element Name Unit Qty Remark
X-ray high-voltage generator XRD40*600 high-frequency high-voltage generator X-ray generator set 1 Solid technology
X27.06 high voltage cable(100kVP) piece 1 Length:2.0 meter
3311 pipe sleeve set 1  
X25.02 stage(Metal shell) piece 1 Lead+ lead glass protection
AS2910/24 Metal ceramic insulation X-ray tube piece 1 Cu target, 2.4kW


Goniometer System
AG-3511 goniometer set 1 θ-θ structure
Slit and powder sample holder piece 1 1 set for each
Through-hole sample plate piece 5 Aluminium matrix
Blind-hole sample plate piece 10 Quartz matrix
Filter piece 1 Match with target material
Slit Plate and Lighting System Adjustment Accessories set 1  
Recording and controlling system Closed proportional detector set 1 Including connecting cable
Recording and controlling unit set 1  
Motor and communication cable piece 1 2 motor cables, 1 communication cable
Power supply unit set 1  
PC system DELL Business notebook set 1 DELL
System Control and Applicable Software AL Series Diffractometer Control Program Software Set
 
1 Windows10
Data processing and application software set 1 Jade 6
Diffraction data card base set 1 PDF2
Crystal Structure Data Base set 1 ICSD
Technical documents AL series XRD user manual copy 1  
Spare parts Fuses 1,1.5,2,2.5,3,3+(A) piece 10 10 pieces for each
Tools set 1  
Agate Mortar ф100mm piece 1  
X-ray Diffraction Analysis Xrd DiffractometerX-ray diffractometer analyzes natural or synthetic inorganicor organic material,widely used in the field of clay minerals,cement, building materials,environmental dust,chemicalproducts, pharmaceuticals, asbestos, rock, polymer research.
θ-θ geometry-based optical design is easy for sample preparation and the installation of various accessories The application of metal ceramic X-ray tube greatly enhanced diffractometer's operating power Closed proportional counter is durable and maintenance-free
Silicon drift detector, with superior angular resolution and energy resolution, enables measurement speed increased by more than 3 times Varies diffractometer accessories meet different analytical purposes needs Modular design,known as plug-and-play components, allows operators to accurately use diffractometer corresponding attachments,without needing calculating optical system.

X-ray Diffraction Analysis Xrd DiffractometerX-ray Diffraction Analysis Xrd DiffractometerX-ray Diffraction Analysis Xrd DiffractometerX-ray Diffraction Analysis Xrd DiffractometerOptical system converter
Sola slit structure can be changed without needing to disassemble Sola slit body. Due to this character,the instrument,without needing readjust,can achieve the converter between focus optical system and horizontal optical system.

Data processing software includes the following features

Basic data processing functions (peak searching,smoothing,background subtraction,peak shape fitting,peak shape enlargement,spectra comparison,K α 1, α 2 stripping,diffraction lines indexing );
No-standard sample's rapid quantitative analysis
Crystal size measurement
Crystal structure analysis (crystal cell parameters rmeasurement and refinement)
Macroscopic stress measurements and microscopic stress
Two-dimensional and three-dimensional display ofmultiple drawing
Diffraction peak drawings' cluster analysis
Diffraction data's half-peak width calibration curve
Deviation data's angular deviation correction curve
Rietveld based conventional quantitative analysis
Use lCDD database or user database to perform phase qualitative analysis
Use ICDD database or ICSD database to perform quantitative analysis
 

X-ray Diffraction Analysis Xrd Diffractometer

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X-ray Diffraction Analysis Xrd Diffractometer

 

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